泰克示波器探頭P6243 有源電壓探頭 優勢供應
P6245是美國Tektronix公司專為500M和500M以上示波器設計的、zui大可達1.5GHz有源FET探頭產品。該產品能夠滿足超過1GHz的帶寬的測試要求,能夠直接進行間距大于0.5mm的SMD測試,特別適合于高速信號采集、低電路負載的測量場合。
性能特點:
□ 精巧的探頭設計,能夠直接進行間隔大于0.5mm的SMD測試;
□ 能進行CMOS、BiCMOS、ECL、GaAS和TTL邏輯;
□ 組合式結構:使用更加靈活,能夠適應更多的測試場合;
□ TekProbeTM BNC接口支持,能自動被示波器識別,直接被示波器供電;
□ 符合多種安全標準:UL3111-1、CSA1010.1、ENG61010-2-031。
技術參數:
□ 帶寬:1.5GHz(典型值,僅指探頭);
□ 衰減比:10×;
□ 輸入阻抗:輸入電阻=1MΩ,輸入電容<1pF;
□ 補償電容:8~12Pf;
□ zui大電壓:±15V(DC+PkAC);
□ 直流補償范圍:10V;
□ 傳輸延遲:5.3ns±200ps;
□ 電纜長:1.3米;
應用領域
□ 兼容的示波器產品:TDS3000、TDS3000B、TDS500、TDS600、TDS700;
□ 高速數字電路設計;
□ 組件設計、分析;
□ 教學研究;
□ 生產制造、測試
The P6245 Active FET probe achieves high-speed signal acquisition by solving three traditional problems:
The P6245 and P6243 Active probes provide the electrical and mechanical performance required for today's digital systems designs. No additional power supplies or cables are required when used with TEKPROBE BNC oscilloscopes. Both the P6245 and P6243 achieve high-speed signal acquisition and low circuit loading, required for solving today's problems faced by designers.
The small compact probe head and versatile attachment accessories allow direct connection to the device under test.
The P6245 and P6243 Active Probes provide scope bandwidth at the probe tip for the TDS500/600/700; the P6243 provides scope bandwidth at the probe tip for the TDS3000 Series scope up to 1 GHz bandwidth.
1* Some TDS6000 or TDS7000 oscilloscopes require a TCA-BNC adapter.
The P6243 Active FET probe is the high performance probing solution for 500 MHz oscilloscopes. The P6243 has a probe only bandwidth of 1 GHz and will provide a 500 MHz system bandwidth when used with Tektronix' full line of 500 MHz oscilloscopes. In addition, the P6243 is powered by the TEKPROBE BNC interface, eliminating the need for additional power supplies and cables when used with TEKPROBE BNC oscilloscopes.
The P6243 offers superior signal acquisition on surface mount devices compared to the much higher capacitive loading of passive probes. The P6243 has ≤1 pF capacitive loading which allows it to measure high speed signals without affecting the signal or device under test. Furthermore, the included accessories and adapters allow for easy attachment to SMDs.